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Transmission Electron Microscope (TEM)


The transmission electron microscope (TEM) at JIAM at UT is located in SERF 101. This TEM is used for atomic and micro-scale investigations in materials science of solid and soft materials (polymers). It is also used for diagnostics in medical science and in research of biology and agriculture. Most applications are in imaging small features in cells or materials and tomographic investigations through tilt series at liquid nitrogen temperatures within the TEM. This microscope was specifically designed to enable chemical investigations on the atomic length scale. We can also map surface plasmons and band gaps with sub-nanometer resolution.

Result of the Month

The localized surface plasmon response of a bimetallic nanoparticle was recorded with the help of mono-chromated EELS. The spectra were fitted with Lorenzians to determine position and intensity of the plasmonic response. Results were obtained by Ritesh Sachan and Jinxuan Ge.


  • High Tilt Tomography Transmission Electron Microscope
  • 60 – 200kV acceleration voltage
  • Spatial resolution of 0.24 nm
  • Tilt angle ± 70°
  • Cryo tomography holder
  • Monochromator gives an energy resolution in EELS of better than 0.2 eV
  • In Column energy filter
  • Scanning unit for Scanning Transmission Electron Microscopy
  • Energy Dispersive X-Ray Spectroscope

Possible Techniques

  • High resolution TEM
  • Conventional TEM
  • Z-contrast Imaging
  • Electron Energy-Loss Spectroscopy
  • Spectrum Imaging and Energy-Filtered Imaging
  • Energy Dispersive X-Ray Spectroscopy (EDS)
  • Selected Arrea and Convergent Beam Diffraftion
  • Energy-Filtered Tomography
  • Cryo-TEM

Existing users may book time via Stratocore. New users contact Dr. Evans.