The University of Tennessee, Knoxville

Joint Institute for Advanced Materials


Transmission Electron Microscope (TEM)

Zeiss Libra 200 HT FE MC

TEM

The transmission electron microscope (TEM) at JIAM at UT is located in SERF 101. This TEM is used for atomic and micro-scale investigations in materials science of solid and soft materials (polymers). It is also used for diagnostics in medical science and in research of biology and agriculture. Most applications are in imaging small features in cells or materials and tomographic investigations through tilt series at liquid nitrogen temperatures within the TEM. This microscope was specifically designed to enable chemical investigations on the atomic length scale. We can also map surface plasmons and band gaps with sub-nanometer resolution.

Features

  • High Tilt Tomography Transmission Electron Microscope
  • 60 - 200kV acceleration voltage
  • Spatial resolution of 0.24 nm
  • Tilt angle ± 70°
  • Cryo tomography holder
  • Monochromator gives an energy resolution in EELS of better than 0.2 eV
  • In Column energy filter
  • Scanning unit for Scanning Transmission Electron Microscopy
  • Energy Dispersive X-Ray Spectroscope

Possible Techniques

  • High resolution TEM
  • Conventional TEM
  • Z-contrast Imaging
  • Electron Energy-Loss Spectroscopy
  • Spectrum Imaging and Energy-Filtered Imaging
  • Energy Dispersive X-Ray Spectroscopy (EDS)
  • Selected Arrea and Convergent Beam Diffraftion
  • Energy-Filtered Tomography
  • Cryo-TEM

 

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