The University of Tennessee, Knoxville

Joint Institute for Advanced Materials


Sample Preparation

The sample prep lab at JIAM is equipped for standard sample preparation for transmission electron microscopy. The following instruments are available in SERF 101. There is additional equipment available for biological and polymer sample preparation.

Plasma Cleaner – Fischione

Image reproduced with courtesy of Fischione Instruments, Inc.This instrument provides plasma that allows us to clean sample holders of the TEM and FIB and the samples themselves. An oxygen plasma is ignited and the cleaning process occurs at the periphery of this plasma.


Precision Ion Mill – Gatan PIPS

Image reproduced with courtesy of Gatan, Inc.This instrument thins TEM samples without contact by bombarding it with fast (1-6kV) Argon ions. This ion mill produces a small hole in the TEM sample wth the rim thin enough to be electron transparent in the transmission electron microscope


Dimpling Grinder – Fischione

Image reproduced with courtesy of Fischione Instruments, Inc.A thin section of a sample is placed at the table of this dimpler. The grinding wheel and the table rotate. The sample is thereby thinned in a small dimple to a few tens of micrometer.


Leica Ultramicrotome EM UC7

Image reproduced with courtesy of Leica MicrosystemsThis piece of equipment provides easy preparation of semi and ultrathin sections, as well as perfect, perfect smooth surfaces of biological and industrial samples for TEM, SEM, AFM and LM examination. It also has an attachable cryochamber for materials too soft to be sectioned at room temperature.


Leica Mill EM TRIM2

Image reproduced with courtesy of Leica MicrosystemsThis is a high speed milling system with an integrated stereomicroscope and LED ring illuminator for trimming of biological and industrial samples prior to ultramicrotomy.


Allied Multiprep Polisher

Image reproduced with courtesy of Allied High Tech Products, Inc.The MultiPrep System enables precise semi-automatic sample preparation of a wide range of materials for microscopic (optical, SEM, FIB, TEM, AFM, etc.) evaluation.


Allied Techcut 4 Slow Speed Saw

Image reproduced with courtesy of Allied High Tech Products, Inc.This is a low-speed saw excellent for cutting smaller, delicate samples that cannot tolerate excessive friction and heat caused by high speed sectioning. 


Plunge Freezer – Gatan

Image reproduced with courtesy of Gatan, Inc.This plunge freezer enables to freeze TEM samples quickly to liquid nitrogen temperatures. The environmental chamber allows to first equilibrate the sample to a controlled hydration state, and then cool it down fast to cytostatic temperatures for investigation in the cryo-TEM.

 


 

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