The University of Tennessee, Knoxville

Joint Institute for Advanced Materials


JIAM Diffraction Facility - Software

The XRD facility utilizes Highscore software for data analysis. We provide access to the PDF-4+ database, allowing you to compare your X-ray diffraction pattern to approximately 380,000 reported patterns. You are able to restrict the software to look for compounds in different categories (e.g., inorganic, organic, mineral, etc.) or compounds with certain elements.

Highscore can perform Rietveld refinements, but if you would like to use a program on your own computer, there are some free options available. Two such options are

GSAS II

FullProf

Tutorials and examples can be found for each on their respective websites.


 

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