The University of Tennessee, Knoxville

Joint Institute for Advanced Materials


David C. Joy

David Joy

Distinguished Professor
Department of Materials Science and Engineering

PhD
Oxford

Research Interests

  • Ion Beam Microscopy and Microanalysis
  • Techniques to quantify the imaging performance of electron and ion microscopes
  • Monte Carlo modeling of electron and ion interactions with solids, liquids, and gases

Selected Publications

Joy D C, (2008), ‘The aberration corrected SEM’, Chapter 3 in Biological Low-Voltage Scanning Electron Microscopy, ed H Schatten and J Pawley, (Springer Science, New   York), p107-128.

Joy D C, (2008), ‘Noise and its Effects on the Low-Voltage SEM’, Chapter 4 in Biological Low-Voltage Scanning Electron Microscopy, ed H Schatten and J Pawley, (Springer Science, New York), p129-145.

Klein KL, Melechko A V, McKnight T E, Retterer ST, Rack R D, Fowlkes J D, Joy DC and Simpson ML, (2008), ‘Surface Characterization and functionalization of carbon nanofibers’, J.Appl.Phys., 103 (6), 061301.

Ramachandra R, Griffin B, Joy DC, (2009), ‘A model of secondary electron imaging in the Helium Ion scanning microscope’, Ultramicroscopy 109, 748-757.

Joy, D C  (2009), “Scanning Electron Microscopy: Second Best no more”, Nature Materials 8, (10), 776-777.

Hildebrand, M., G. Holton, D. C. Joy, M. J. Doktycz, D. P. Allison (2009)  "Diverse and conserved nano-and mesoscale structures of diatom silica revealed by atomic force microscopy” J. Microscopy 2009; 235(2): 172-187.

Contact Information

David C. Joy
232 Science and Engineering Research Facility
Department of Materials Science and Engineering
University of Tennessee
Knoxville, TN 37996-2200
865-974-3642
djoy@utk.edu

 

 


 

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